Surface Analysis
The Surface Analysis Lab provides nanoscale measuments of chemical composition and bonding for the top 5-10 nm of solid surfaces through X-ray Photoelectron Spectroscopy. Additionally, the Surface Analysis Lab houses instrumentation for Powder X-ray Diffraction, X-ray Emission Spectroscopy, and X-ray Absorption Fine Structure.
| Per Hour | |||
|---|---|---|---|
| Instruments | Internal | Federal | External |
| CD | $8.00 | $13.00 | $120.00 |
| MPXRD | $7.00 | $11.00 | $60.00 |
| XAFS | $40.00 | $64.00 | $260.00 |
| XES | $40.00 | $64.00 | $260.00 |
| XPS | $25.00 | $40.00 | $95.00 |
| Tech Assist | $40.00 | $64.00 | $120.00 |
- SAL Orientation
- XPS Data Analysis
- XPS User Training
- PXRD User Training
- XAFS User Training
- Brimstone XES User Training
Physical Electronics Genesis
- Signal from top 5-10 nm of surface
- 5 µm minimum beam size
- Hot (500°C) / Cold (-100°C) Stage
- Inert sample transfer vessel for samples sensitive to atmosphere
Rigaku Miniflex 600
- Phase identification and quantification
- Graphite monochromator for increased S/N
- 6-position automated sample changer with integrated spinner
easyXAFS easyXES150
- Hard X-ray absorption fine structure spectrometer (4.5-25+ keV)
- Bulk (several µm) measurement
- Lanthanide sensitivity
easyXAFS Brimstone
- Tender X-ray emission spectrometer (2-5 keV)
- ~1 eV energy resolution
- Sensitive for P and S
easyXAFS easyXES150
- Hard X-ray emission spectrometer (4.5-25+ keV)
- Bulk (several µm) measurement
- Lanthanide sensitivity
How to fill out an Analytical Services ISR
Supplier: "VT Chemistry Surface Analysis Service Center"
Direct link to FACES Scheduling System
FACES Group: VT_SAL
Contact Nicholas Popczun
nip@vt.edu
540-231-6604
Data analysis Resources
Data repositories and information
Sample Preparation Guides
Additional Guides and Manuals *************
When co-authorship is expected:
- Substantial intellectual contributions to experimental design, data interpretation, or manuscript preparation
- Specialized technique development or troubleshooting beyond routine support
- Custom method development, extensive troubleshooting, or data analysis assistance
When acknowledgment (not co-authorship) is sufficient:
- Routine training and instrument access
- Standard walkup experiments without significant staff involvement
- Minor troubleshooting or parameter adjustments
Best practice: Discuss authorship expectations early in your project with facility staff to avoid misunderstandings.
Experimental Methods
X-ray Photoelectron Spectroscopy. XPS spectra were collected on a PHI Genesis spectrometer using an aluminum anode X-ray source with a photon energy of 1486.6 eV. Survey spectra were collected with a 25 W, 15 kV source producing a 100 µm beam with a scan range of 1100 to 0 eV with a step size of 0.5 eV and pass energy of 280 eV. High resolution spectra were collected with a step size of step size of 0.1 eV and pass energy of 26 eV.
Replace bold and underlined sections with information provided on your XPS report
Acknowledgements
This work was performed in part at the Virginia Tech Surface Analysis Laboratory (RRID:SCR_27504) which is supported by the National Science Foundation under Grant No. CHE-1531834.
If using CasaXPS for data analysis, please cite:
- Fairley, Neal, et al. "Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy." Applied Surface Science Advances 5 (2021): 100112.
Experimental Methods
Powder X-ray Diffraction. PXRD spectra were collected on a Rigaku Miniflex 600 spectrometer using an copper anode X-ray source. Diffractograms were collected with a 2 theta range of 3 to 90 at a speed of 15 degrees/min and step size of 1.
Replace the bold and underlined sections with information from the General Measurement settings.
Acknowledgements
This work was performed in part at the Virginia Tech Surface Analysis Laboratory (RRID:SCR_27504)
Experimental Methods
X-ray Absorption Fine Structure / X-ray Emission Spectroscopy. XAFS / XES spectra were collected on a (easyXAFS easyXES150 / easyXAFS Brimstone) spectrometer using a tungsten anode X-ray source. Spectra were collected with 70W from on the Fe K edge with 0.25 eV steps for a duration of 2 seconds per point.
Replace the bold and underlined sections with information from the General Measurement settings.
Acknowledgements
This work was performed in part at the Virginia Tech Surface Analysis Laboratory (RRID:SCR_27504)
Laboratory Hours
Staffed Hours: 9 AM - 5 PM, M-F
24/7 access for trained users
Contact SAL Staff
Nicholas Popczun
SAL Facility Manager
njp@vt.edu
540-231-6604
Emergency Contact
VT Environmental Health & Safety
540-231-5364
www.ehs.vt.edu
Kenny Smith
Facilities Manager
kesmith7@vt.edu
Drew Murphy
Safety Coordinator
drewmurphy23@vt.edu
Lab Address
Hahn Hall South 008
Virginia Tech
900 W. Campus Blvd.
Blacksburg, VA 24061